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[资源共享] An.Introduction.To.Surface.Analysis.By.XPS.And.AES

An.Introduction.To.Surface.Analysis.By.XPS.And.AES

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An Introduction to Surface Analysis by XPS and AES (Paperback)
by John F. Watts (Author), John Wolstenholme (Author) "All solid materials interact with their surroundings through their surfaces..." (more)
Key Phrases: retard ratio, chemical state information, compositional depth profiling, John Wiley, Sons Limited, Elsevier Science (more...)
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Book Description
Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.

Book Info
Text provides an introduction to the key electron spectroscopic techniques used in surface analysis. Covers the basic concepts of electron spectroscopy, the underlying physical principles, and the instrumentation employed. A supplementary text for undergraduate and masters level students. Softcover, hardcover available. DLC: Surfaces (Technology)--Analysis.

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Product Details
Inside This Book
Citations: This book cites 1 book | 10 books that cite this book Explore: Citations | Books on Related Topics | Concordance | Text Stats Key Phrases - SIPs: retard ratio, chemical state information, compositional depth profiling, ball cratering, electron energy analyser (more) Key Phrases - CAPs: John Wiley, Sons Limited, Elsevier Science, National Physical Laboratory, Sample Figure Browse Sample Pages: Front Cover | Copyright | Table of Contents | Excerpt | Index | Back Cover | Surprise Me!
Search Inside This Book:
[hr]Inside This Book (learn more) First Sentence:
All solid materials interact with their surroundings through their surfaces. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
retard ratio, chemical state information, compositional depth profiling, ball cratering, electron energy analyser, transfer lens, specimen kindly, primary beam energy, photoelectron peak, sputter yield, sample charging, parallel acquisition, electron spectrometer, small area analysis, electron spectroscopy, field emission source, survey spectrum, ion gun, peak fitting, pass energy, flow agent, corrosion science, attenuation length, resultant spectrum, surface segregation Key Phrases - Capitalized Phrases (CAPs): (learn more)
John Wiley, Sons Limited, Elsevier Science, National Physical Laboratory, Sample Figure New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Copyright | Table of Contents | Excerpt | Index | Back Cover | Surprise Me!
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本帖隐藏的内容需要积分高于 1000 才可浏览
“We Know we know,we don't know we don't know”

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借用的amazon 的照片而已
呵呵

这本是wiley的书
红樱桃专家组持续招募中,只要您是某一方向的专家,都可以参加,威望奖励多多,还能进中级区,快来加入吧!
http://www.6yes.com/bbs/viewthread.php?tid=148810&extra=page%3D2

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以为你有高科技呢 [s:39]
“We Know we know,we don't know we don't know”

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谢谢了,希望能下载拉

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