X-Ray Diffraction by Polycrystalline Materials X-Ray Diffraction by Polycrystalline Materials By Rene Guinebretiere Publisher: ISTE Publishing Company Number Of Pages: 288 Publication Date: 2008-02-04 ISBN-10 / ASIN: 1905209215 ISBN-13 / EAN: 9781905209217 Binding: Hardcover This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use. [ 本帖最后由 crrt 于 2008-1-17 00:13 编辑 ]

已按论坛要求的统一方式打包加密 论坛统一解压密码www.6yes.com/bbs 上传至www.box.net

本帖隐藏的内容需要回复才可以浏览

thanks

好东西，谢谢了

谢谢，好书！找了好长时间。

此书非常好，感谢楼主分享

X-Ray Diffraction by Polycrystalline Materials

多谢哈

谢谢!!