Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy【Springer2008新书，已搜无重】
【书籍名称】：Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy
【作 者】： Khulbe, Kailash C., Feng, C.Y., Matsuura, Takesi
【出 版 社】：Springer Publishing Company
【版次时间】：电子版: 2008-01
【封面图片】：
【内容简介】：
This is a much-needed text that focuses on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM).
AFM is becoming a very important tool for the characterization of synthetic polymeric membranes, as The development of membranes for improved performance depends on the exact knowledge of the morphology of a thin selective layer that exists at the surface of the membrane.
The control of the morphology of the selective layer is crucial for the design of synthetic polymeric membranes. With a relatively short history of twenty-five years, AFM has firmly established its position as a means of characterizing the membrane surface.
Here, each chapter includes information on the basic principles, commercial applications, an overview of current research and guidelines for future research. Each also includes a summary and comprehensive list of references.
The book covers all aspects of AFM studies on the characterization of synthetic polymeric membranes.
This work will be of wide interest, as synthetic membranes are now considered to be one of the most important tools in areas as crucial as seawater desalination, waste-water treatment, and water production.
【其他信息】：
Number Of Pages: 216
ISBN-10 / ASIN: 3540739939
ISBN-13 / EAN: 9783540739937
Binding: Hardcover
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